Board Level Boundary Scan Testing and Test Controllers
نویسنده
چکیده
This paper discusses some of the issues related to board level testing. The main interest is focused on the boundary scan technique combined with an on board test controller, and the problems of how complete systems with several boards should be tested in a hierarchial test environment. Test controller design issues are discussed, together with a description of which functionality a test controller should provide, and what design trade offs have to be made.
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